Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitlePRODUCT NEWS.AuthorsWagner, LarryAbstractThe article offers brief information on several electrical failure analysis system including Helios G4 DualBeam series from FEI, the Meridian M system from DCG Systems, and inVia confocal Raman microscope from Renishaw.SubjectsFAILURE analysis; MICROSCOPES; FEI Co.; DCG Systems Inc.; RENISHAW PLC; EQUIPMENT &; suppliesPublicationElectronic Device Failure Analysis, 2016, Vol 18, Issue 1, p42ISSN1537-0755Publication typeProduct Review