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- Title
Crystalline Quality and Structure of MBE-Grown Ferromagnetic Semiconductor ZnSnAs<sub>2</sub>:Mn Thin Films Revealed by High-Resolution X-ray Diffraction Measurements.
- Authors
Uchitomi, Naotaka; Toyota, Hideyuki; Takahashi, Toshio
- Abstract
The crystalline structure and quality of ZnSnAs2:Mn films grown by molecular beam epitaxy (MBE) on InP substrates are two of the most important issues in preparing spintronic structures such as magnetic quantum wells and spin-based transistors. We conducted high-resolution X-ray diffraction (XRD) measurements to clarify the crystalline structure of ZnSnAs2:Mn thin films. The XRD measurements reveal with very high accuracy that the samples have a sphalerite structure with high epitaxial quality. These results, within the limits of measurement accuracy support the previous assumption that ZnSnAs2:Mn thin films are coherently clustered ferromagnetic semiconductors without breaking the continuity of the sphalerite structure, leading to ferromagnetism with a high Curie temperature close to that of zincblende MnAs.
- Subjects
CHEMICAL beam epitaxy; X-ray diffraction; FERROMAGNETIC materials
- Publication
Zeitschrift für Physikalische Chemie, 2016, Vol 230, Issue 4, p499
- ISSN
0942-9352
- Publication type
Article
- DOI
10.1515/zpch-2015-0649