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- Title
Evaluation of Residual Stress in a Multilayer Ceramic Capacitor and its Effect on Dielectric Behaviors Under Applied dc Bias Field.
- Authors
Gang Yang; Zhenxing Yue; Tieyu Sun; Wugui Jiang; Xiang Li; Longtu Li
- Abstract
The residual stress in a multilayer ceramic capacitor (MLCC) has been evaluated by two-dimensional finite element simulation in combination with X-ray diffraction measurement. It is shown that there is a compressive in-plane stress in the active layers of the MLCC, which increases with increases in the number of dielectric layers when both dielectric layer thickness and electrode thickness are kept constant. A good order of magnitude agreement between the residual stresses obtained from two approaches is found. The ℇ– V response of the MLCC with different number of dielectric layers demonstrates that under a given or no applied field, the dielectric permittivity increases with increasing compressive stress. Additionally, under dc bias field, the higher the compressive in-plane stress existing in the MLCC, the more significant the decrease of the dielectric permittivity. These results can be explained through a phenomenological thermodynamic model, including both elastic and electrostatic energy, based on the Ginsburg–Landau–Devonshire theory.
- Subjects
RESIDUAL stresses; CERAMIC capacitors; DIELECTRICS; FINITE element method; X-ray diffraction; ELECTRODES; PERMITTIVITY; THERMODYNAMICS; ELECTROSTATICS
- Publication
Journal of the American Ceramic Society, 2008, Vol 91, Issue 3, p887
- ISSN
0002-7820
- Publication type
Article
- DOI
10.1111/j.1551-2916.2007.01868.x